000 01460cam a2200337 a 4500
001 11970842
003 BD-DhUL
005 20140909124221.0
008 000411s2000 nyua b 001 0 eng
010 _a 00036843
020 _a0471356328 (cloth : alk. paper)
040 _aDLC
_cDLC
_dDLC
_dBD-DhUL
050 0 0 _aQA278.2
_b.H67 2000
082 0 0 _a519.536
_221
_bHOA
100 1 _aHosmer, David W.
245 1 0 _aApplied logistic regression /
_cDavid W. Hosmer, Stanley Lemeshow.
250 _a2nd ed.
260 _aNew York :
_bWiley,
_cc2000.
300 _axii, 373 p. :
_bill. ;
_c25 cm.
440 0 _aWiley series in probability and statistics.
_pTexts and references section
500 _a"A Wiley-Interscience publication."
504 _aIncludes bibliographical references (p. 352-365) and index.
650 0 _aRegression analysis.
700 1 _aLemeshow, Stanley.
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/bios/wiley042/00036843.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/wiley034/00036843.html
856 4 _3Table of Contents
_uhttp://www.loc.gov/catdir/toc/onix05/00036843.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
942 _2ddc
_cBK
955 _ato ASCD pv00 04-11-00; jp43 04-17-00 to jp99; jp99 to SL 04-19-00;jp85; to Dewey 04-20-00;aa03 4-24-00; jp00 10-04-00; CIP ver. (2 copies) jp20 10-06-00 to SL; jp14 2 copies to BCCD 10-10-00
999 _c9182
_d9182