000			01353cam a2200337 a 4500
001			4345535
003			BD-DhUL
005			20140909112522.0
008			890314s1989 nyu b 001 0 eng
010			_a 89031893
020			_a0471615536
040			_aDLC _cDLC _dDLC _dBD-DhUL
050	0	0	_aQA278.2 _b.H67 1989
082	0	0	_a519.536 _220 _bHOA
100	1		_aHosmer, David W.
245	1	0	_aApplied logistic regression / _cDavid W. Hosmer, Jr., Stanley Lemeshow.
260			_aNew York : _bWiley, _cc1989.
300			_axiii, 307 p. ; _c24 cm.
365			_aUS$ _b72.75
490	0		_aWiley series in probability and mathematical statistics. Applied probability and statistics
500			_a"A Wiley-Interscience publication."
504			_aIncludes bibliographical references and index.
650		0	_aRegression analysis.
700	1		_aLemeshow, Stanley.
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0607/89031893-d.html
856	4	1	_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0607/89031893-t.html
856	4	2	_3Contributor biographical information _uhttp://www.loc.gov/catdir/enhancements/fy0607/89031893-b.html
906			_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg
942			_2ddc _cBK
955			_apc05 to br00 03-14-89; br30 to SCD 03-15-89; fg04 03-16-89; fm32 03-22-89
999			_c9094 _d9094