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|---|---|---|---|
| 001 | 13910153 | ||
| 003 | BD-DhUL | ||
| 005 | 20140819092844.0 | ||
| 008 | 050324s2005 nyua b 001 0 eng d | ||
| 010 | _a 2005924717 | ||
| 020 | _z9780387258000 | ||
| 020 | _a0387258000 | ||
| 035 | _a(OCoLC)ocm61714990 | ||
| 040 |
_aOHX _cOHX _dUAB _dIXA _dDLC _dBD-DhUL |
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| 042 | _alccopycat | ||
| 050 | 0 | 0 |
_aQH212.E4 _bE354 2005 |
| 072 | 7 |
_aQC _2lcco |
|
| 082 |
_a502.825 _bEGP |
||
| 100 | 1 | _aEgerton, R. F. | |
| 245 | 1 | 0 |
_aPhysical principles of electron microscopy : _ban introduction to TEM, SEM, and AEM / _cby Ray F. Egerton. |
| 260 |
_aNew York : _bSpringer, _cc2005. |
||
| 300 |
_axii, 202 p. : _bill. ; _c25 cm. |
||
| 365 |
_aUS$ _b98.50 |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aElectron microscopy. | |
| 856 | 4 | 1 |
_3Table of contents _uhttp://www.loc.gov/catdir/toc/fy0605/2005924717.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0663/2005924717-d.html |
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_ajb11 2006-02-14 z-processor _cjb11 2006-02-14; to subj. _aja15 2006-04-27 copy 2 added |
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| 955 |
_apc20 2005-03-24 _ajb00 2006-02-10 _ajp00 2006-03-13 |
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| 999 |
_c3838 _d3838 |
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