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005 20140819092844.0
008 050324s2005 nyua b 001 0 eng d
010 _a 2005924717
020 _z9780387258000
020 _a0387258000
035 _a(OCoLC)ocm61714990
040 _aOHX
_cOHX
_dUAB
_dIXA
_dDLC
_dBD-DhUL
042 _alccopycat
050 0 0 _aQH212.E4
_bE354 2005
072 7 _aQC
_2lcco
082 _a502.825
_bEGP
100 1 _aEgerton, R. F.
245 1 0 _aPhysical principles of electron microscopy :
_ban introduction to TEM, SEM, and AEM /
_cby Ray F. Egerton.
260 _aNew York :
_bSpringer,
_cc2005.
300 _axii, 202 p. :
_bill. ;
_c25 cm.
365 _aUS$
_b98.50
504 _aIncludes bibliographical references and index.
650 0 _aElectron microscopy.
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/fy0605/2005924717.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0663/2005924717-d.html
906 _a7
_bcbc
_ccopycat
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942 _2ddc
_cBK
955 _ajb11 2006-02-14 z-processor
_cjb11 2006-02-14; to subj.
_aja15 2006-04-27 copy 2 added
955 _apc20 2005-03-24
_ajb00 2006-02-10
_ajp00 2006-03-13
999 _c3838
_d3838