000			01504pam a2200361 a 4500
001			3034835
003			BD-DhUL
005			20140819091829.0
008			950914r19951993nyua b 001 0 eng
010			_a 95039017
020			_a0195107519 (acidfree paper)
020			_a9780195107517
040			_aDLC _cDLC _dDLC _dBD-DhUL
050	0	0	_aQH212.S3 _bF58 1995
082	0	0	_a502.825 _220 _bFLS
100	1		_aFlegler, Stanley L.
245	1	0	_aScanning and transmission electron microscopy : _ban introduction / _cby Stanley L. Flegler, John W. Heckman, Jr. and Karen L. Klomparens.
260			_aNew York : _bOxford University Press, _c1993.
300			_aviii, 225 p. : _bill. ; _c26 cm.
365			_aUS$ _b74.65
500			_aOriginally published: New York : W.H. Freeman, c1993.
504			_aIncludes bibliographical references and index.
650		0	_aScanning electron microscopy.
650		0	_aTransmission electron microscopy.
700	1		_aHeckman, John William.
700	1		_aKlomparens, Karen L.
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0603/95039017-d.html
856	4	1	_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0603/95039017-t.html
856	4	2	_3Contributor biographical information _uhttp://www.loc.gov/catdir/enhancements/fy0723/95039017-b.html
906			_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg
942			_2ddc _cBK
955			_apc14 to ja00 09-14-95; jb09 09-14-95;jb02 09-15-95; CIP ver. pv08 09-09-96
999			_c3829 _d3829