000			01707cam a2200385 a 4500
001			2615776
003			BD-DhUL
005			20150123180634.0
008			980611s1999 nyua b 001 0 eng
010			_a 98027511
020			_a0471154105 (cloth : alk. paper)
040			_aDLC _cDLC _dDLC _dBD-DhUL
050	0	0	_aR853.S7 _bH67 1999
082	0	0	_a610.727 _221 _bHOA
100	1		_aHosmer, David W.
245	1	0	_aApplied survival analysis : _bregression modeling of time to event data / _cDavid W. Hosmer, Jr. and Stanley Lemeshow.
260			_aNew York : _bJohn Wiley & Sons, _cc1999.
300			_axiii, 386 p. : _bill. ; _c24 cm.
365			_aUS$ _b84.95
440		0	_aWiley series in probability and statistics. _pTexts and references section
500			_a"A Wiley-Interscience publication."
504			_aIncludes bibliographical references (p. 365-377) and index.
650		0	_aMedicine _xResearch _xStatistical methods.
650		0	_aMedical sciences _xStatistical methods _xComputer programs.
650		0	_aRegression analysis _xData processing.
650		0	_aPrognosis _xStatistical methods.
650		0	_aLogistic distribution.
700	1		_aLemeshow, Stanley., _ejoint author.
856	4	2	_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley046/98027511.html
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley0310/98027511.html
856	4		_3Table of Contents _uhttp://www.loc.gov/catdir/toc/onix03/98027511.html
906			_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg
942			_2ddc _cBK
955			_apc14 to ja00 06-12-98; jd25 06-12-98; jd99 to jc00 (R?) 06-16-98; jc15 06-18-98; jc03 06-18-98; CIP ver. jb11 03-09-99
999			_c35698 _d35698