| 000 | 01188pam a2200313 a 4500 | ||
|---|---|---|---|
| 001 | 2453403 | ||
| 003 | BD-DhUL | ||
| 005 | 20150115144014.0 | ||
| 008 | 890922s1990 nyua b s001 0 eng | ||
| 010 | _a 89024881 | ||
| 020 | _a0471511048 | ||
| 040 |
_aDLC _cDLC _dDLC _dBD-DhUL |
||
| 050 | 0 | 0 |
_aQC611 _b.S335 1990 |
| 082 | 0 | 0 |
_a621.38152 _220 _bSCS |
| 100 | 1 | _aSchroder, Dieter K. | |
| 245 | 1 | 0 |
_aSemiconductor material and device characterization / _cDieter K. Schroder. |
| 260 |
_aNew York : _bWiley, _cc1990. |
||
| 300 |
_axv, 599 p. : _bill. ; _c25 cm. |
||
| 500 | _a"A Wiley-Interscience publication." | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aSemiconductors. | |
| 650 | 0 |
_aSemiconductors _xTesting. |
|
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/enhancements/fy0650/89024881-b.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0650/89024881-d.html |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0650/89024881-t.html |
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
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| 942 |
_2ddc _cBK |
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| 955 | _aCIP ver. be27 to SL 07-27-90 | ||
| 999 |
_c31659 _d31659 |
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