000 01003cam a2200277 i 4500
001 4124837
003 BD-DhUL
005 20150115143917.0
008 760506s1977 nyua b 000 0 eng
010 _a 76017013
020 _a0070042306 :
_c$17.00
040 _aDLC
_cDLC
_dDLC
_dBD-DhUL
050 0 0 _aTK7867
_b.B36 1977
082 0 0 _a621.38153
_bBED
100 1 _aBecker, Peter W.
245 1 0 _aDesign of systems and circuits for maximum reliability or maximum production yield /
_cPeter W. Becker, Finn Jensen.
260 _aNew York :
_bMcGraw-Hill,
_cc1977.
300 _axiv, 293 p. :
_bill. ;
_c24 cm.
504 _aBibliography: p. 281-289.
650 0 _aElectronic circuit design
_xData processing.
650 0 _aElectronic systems
_xDesign and construction
_xData processing.
650 0 _aElectronic apparatus and appliances
_xReliability
_xData processing.
700 1 _aJensen, Finn.
_d1937-
_ejoint author.
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
999 _c31656
_d31656