| 000 | 00746pam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | 1443139 | ||
| 003 | BD-DhUL | ||
| 005 | 20150115141433.0 | ||
| 008 | 850823s1986 nyua b 001 0 eng | ||
| 010 | _a 85021884 | ||
| 020 | _a0060444444 | ||
| 040 |
_aDLC _cDLC _dDLC _dBD-DhUL |
||
| 050 | 0 | 0 |
_aTK7868.D5 _bM49 1986 |
| 082 | 0 | 0 |
_a621.3815 _bMID |
| 100 | 1 | _aMiczo, Alexander. | |
| 245 | 1 | 0 |
_aDigital logic testing and simulation / _cAlexander Miczo. |
| 260 |
_aNew York : _bHarper & Row, _cc1987. |
||
| 300 |
_axiv, 414 p. : _bill. ; _c24 cm. |
||
| 365 |
_aGBP _b12.50 |
||
| 504 | _aIncludes bibliographies and index. | ||
| 650 | 0 |
_aDigital electronics _xTesting. |
|
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c31623 _d31623 |
||