| 000 | 00829pam a2200265 a 4500 | ||
|---|---|---|---|
| 001 | 461272 | ||
| 003 | BD-DhUL | ||
| 005 | 20150115110048.0 | ||
| 008 | 830622s1984 enka b 001 0 eng | ||
| 010 | _a 83011768 | ||
| 020 | _a0201144034 | ||
| 040 |
_aDLC _cDLC _dDLC _dBD-DhUL |
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| 050 | 0 | 0 |
_aTK7868.L6 _bB45 1984 |
| 082 | 0 | 0 |
_a621.381537 _219 _bB 471d |
| 100 | 1 | _aBennetts, R. G. | |
| 245 | 1 | 0 |
_aDesign of testable logic circuits / _cR.G. Bennetts. |
| 260 |
_aLondon ; _aReading, Mass. : _bAddison-Wesley Pub. Co., _cc1984. |
||
| 300 |
_axii, 164 p. : _bill. ; _c25 cm. |
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| 440 | 0 | _aMicroelectronics systems design series | |
| 504 | _aIncludes bibliographies and index. | ||
| 650 | 0 | _aLogic circuits. | |
| 650 | 0 |
_aLogic circuits _xTesting. |
|
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
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| 942 |
_2ddc _cBK |
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| 999 |
_c31422 _d31422 |
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