000			02211cam a22004815i 4500
001			21820786
003			BD-DhUL
005			20210620110814.0
006			m |o d |
007			cr |||||||||||
008			150224s2015 gw |||| o |||| 0|eng
010			_a 2019766493
020			_a9783662452394 (hbk)
024	7		_a10.1007/978-3-662-45240-0 _2doi
035			_a(DE-He213)978-3-662-45240-0
040			_aDLC _beng _epn _erda _cDLC _dBD-DhUL
072		7	_aTBN _2bicssc
072		7	_aTBN _2thema
072		7	_aTEC027000 _2bisacsh
082	0	4	_a502.82 _bVOS _223
100	1		_aVoigtländer, Bert.
245	1	0	_aScanning Probe Microscopy : _batomic force microscopy and scanning tunneling microscopy / _cBert Voigtländer.
264		1	_aBerlin, Heidelberg : _bSpringer, _c2015.
300			_axv, 382 p. : _bill. (some col.) ; _c24 cm.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
365			_aEuro _b129.99
490	0		_aNanoscience and technology
504			_aIncludes bibliographical references and index.
520			_aThis book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
588			_aDescription based on publisher-supplied MARC data.
650		0	_aMicroscopies.
650		0	_aMaterials science
776	0	8	_iPrint version: _tScanning probe microscopy. _z9783662452394 _w(DLC) 2014958892
776	0	8	_iPrinted edition: _z9783662452394
776	0	8	_iPrinted edition: _z9783662452417
776	0	8	_iPrinted edition: _z9783662505571
830		0	_aNanoScience and Technology, _x1434-4904
906			_a0 _bibc _corigres _du _encip _f20 _gy-gencatlg
942			_2ddc _cBK
999			_c254070 _d254070