| 000 | 00630cam a2200217u 4500 | ||
|---|---|---|---|
| 001 | 8446000 | ||
| 003 | BD-DhUL | ||
| 005 | 20141216174551.0 | ||
| 008 | 980304s1964 nyu 000 0 eng | ||
| 010 | _a 63016977 | ||
| 040 |
_aDLC _cCarP _dDLC _dBD-DhUL |
||
| 050 | 0 | 0 |
_a578.15 _bSIM |
| 082 |
_a578.15 _bSIM |
||
| 100 | 1 |
_aSiegel, Benjamin M., [from old catalog] _eed. |
|
| 245 | 0 | 0 | _aModern developments in electron microscopy. |
| 260 |
_aNew York : _bAcademic Press, _c1964. |
||
| 300 |
_axii, 432 p. ; _c24 cm. |
||
| 650 | 0 | _aElectron microscopy. | |
| 906 |
_a0 _bcbc _cpremunv _du _encip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c22670 _d22670 |
||