000			01297pam a2200337 a 4500
001			1460818
003			BD-DhUL
005			20141020160636.0
008			860418s1987 nyua b 001 0 eng
010			_a 86011014
020			_a0471010561
040			_aDLC _cBD-DhUL _dBD-DhUL
050	0	0	_aQD96.S43 _bB46 1987
082	0	0	_a543.0873 _219 _bBES
100	1		_aBenninghoven, A.
245	1	0	_aSecondary ion mass spectrometry : _bbasic concepts, instrumental aspects, applications, and trends / _cA. Benninghoven, F.G. Rüdenauer, H.W. Werner.
260			_aNew York : _bJ. Wiley, _c1987.
300			_axxxv, 1227 p. : _bill. ; _c24 cm.
440		0	_aChemical analysis ; _vv. 86
500			_a"A Wiley-Interscience publication."
500			_aIncludes index.
504			_aBibliography: p. 1125-1216.
650		0	_aSecondary ion mass spectrometry.
700	1		_aRüdenauer, F. G.
700	1		_aWerner, H. W.
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley031/86011014.html
856	4		_3Table of Contents _uhttp://www.loc.gov/catdir/toc/onix01/86011014.html
856	4	2	_3Contributor biographical information _uhttp://www.loc.gov/catdir/enhancements/fy0706/86011014-b.html
906			_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg
942			_2ddc _cBK
999			_c15391 _d15391