000 01091cam a2200349 a 4500
001 823983
003 BD-DhUL
005 20140929122100.0
008 900329s1989 si a b 001 0 eng d
020 _a9971503514
035 _a(OCoLC)21180033
035 _a(OCoLC)ocm21180033
035 _a(CStRLIN)NYCG90-B20751
035 _a(NNC)823983
040 _aNmLaS
_cNmLaS
_dNmLaS
_dNjR
_dBD-DhUL
082 _a539.72112
_bDEF
090 _aQC176.8.E9
_bD43 1989g
245 0 0 _aDefect processes induced by electronic excitation in insulators /
_cNoriaki Itoh.
260 _aTeaneck, N.J. :
_bWorld Scientific,
_cc1989.
300 _avii, 280 p. :
_bill. ;
_c23 cm.
365 _aUS$
_b107.50
490 1 _aDirections in condensed matter physics ;
_vvol. 5
504 _aIncludes bibliographical references and index.
650 0 _aElectronic excitation.
650 0 _aInsulating materials.
650 0 _aHalides.
650 0 _aCrystals
_xDefects.
700 1 _aItoh, Noriaki.
830 0 _aDirections in condensed matter physics ;
_vv. 5.
900 _aAUTH
942 _2ddc
_cBK
999 _c13622
_d13622