| 000 | 00788pam a2200265 i 4500 | ||
|---|---|---|---|
| 001 | 799789 | ||
| 003 | BD-DhUL | ||
| 005 | 20140925084249.0 | ||
| 008 | 750607s1975 nyua b 001 0 eng | ||
| 010 | _a 75019035 | ||
| 020 | _a0070542732 | ||
| 040 |
_aDLC _cDLC _dDLC _dBD-DhUL |
||
| 050 | 0 | 0 |
_aQC611.24 _b.R86 |
| 082 | 0 | 0 |
_a537.622 _bRUS |
| 100 | 1 | _aRunyan, W. R. | |
| 245 | 1 | 0 |
_aSemiconductor measurements and instrumentation / _cW. R. Runyan. |
| 260 |
_aNew York : _bMcGraw-Hill, _c1975. |
||
| 300 |
_avii, 280 p. : _bill. ; _c26 cm. |
||
| 365 |
_a$ _b7.65 |
||
| 490 | 0 | _aTexas Instruments electronics series | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aSemiconductors. | |
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c12892 _d12892 |
||