01367cam a2200337 a 4500 4344893 BD-DhUL 20140909103757.0 890915s1990 nyua b 001 0 eng 89024853 0471522775 DLC DLC DLC BD-DhUL QA276 .N45 1990 519.5 20 NEA Nelson, Wayne, 1936- Accelerated testing : statistical models, test plans and data analyses / Wayne Nelson. New York : Wiley, c1990. xiv, 601 p. : ill. ; 25 cm. USD 100.75 Wiley series in probability and mathematical statistics. Applied probability and statistics "A Wiley-Interscience publication." Includes bibliographical references (p. 561-577). Failure time data analysis. Reliability (Engineering) Statistical methods. Accelerated life testing Statistical methods. Contributor biographical information http://www.loc.gov/catdir/bios/wiley047/89024853.html Publisher description http://www.loc.gov/catdir/description/wiley031/89024853.html Table of Contents http://www.loc.gov/catdir/toc/onix01/89024853.html 7 cbc orignew 1 ocip 19 y-gencatlg ddc BK 9030 9030 0 0 ddc 0 519_500000000000000_NEA 0 NFIC 15933 DUSL DUSL GEN 1994-08-18 Purchased 519.5 NEA 355647(D) 2014-09-09 1 2014-09-09 BK 0 0 ddc 0 519_500000000000000_NEA 0 NFIC 15937 DUSL DUSL GEN 1994-08-18 Purchased 519.5 NEA 355648 2014-09-09 2 2014-09-09 BK