01259cam a2200301 a 45000010008000000030008000080050017000160080041000330100017000740200015000910400027001060500021001330820019001541000026001732450093001992600031002923000034003233650016003574400097003735000040004705040054005106500032005646500052005966500051006488560096006998560088007958560074008834344893BD-DhUL20140909103757.0890915s1990    nyua     b    001 0 eng    a   89024853   a0471522775  aDLCcDLCdDLCdBD-DhUL00aQA276b.N45 199000a519.5220bNEA1 aNelson, Wayne,d1936-10aAccelerated testing :bstatistical models, test plans and data analyses /cWayne Nelson.  aNew York :bWiley,cc1990.  axiv, 601 p. :bill. ;c25 cm.  aUSDb100.75 0aWiley series in probability and mathematical statistics.pApplied probability and statistics  a"A Wiley-Interscience publication."  aIncludes bibliographical references (p. 561-577). 0aFailure time data analysis. 0aReliability (Engineering)xStatistical methods. 0aAccelerated life testingxStatistical methods.423Contributor biographical informationuhttp://www.loc.gov/catdir/bios/wiley047/89024853.html423Publisher descriptionuhttp://www.loc.gov/catdir/description/wiley031/89024853.html4 3Table of Contentsuhttp://www.loc.gov/catdir/toc/onix01/89024853.html