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  xmlns:dcterms="http://purl.org/dc/terms/"><dc:Title>Accelerated testing : statistical models, test plans and data analyses / Wayne Nelson.</dc:Title>
<dc:Creator>Nelson, Wayne, 1936-</dc:Creator>
<dc:Subject>Failure time data analysis.</dc:Subject>
<dc:Subject>Reliability (Engineering) Statistical methods.</dc:Subject>
<dc:Subject>Accelerated life testing Statistical methods.</dc:Subject>
<dc:Subject>QA276 .N45 1990</dc:Subject>
<dc:Subject>519.5 20 NEA</dc:Subject>
<dc:Description>"A Wiley-Interscience publication."</dc:Description>
<dc:Description>Includes bibliographical references (p. 561-577).</dc:Description>
<dc:Publisher>New York : Wiley,</dc:Publisher>
<dc:Date>c1990.</dc:Date>
<dc:Date>c1990.</dc:Date>
<dc:Date>1990</dc:Date>
<dc:Type>Text</dc:Type>
<dc:Format>xiv, 601 p. :</dc:Format>
<dc:Identifier>http://www.loc.gov/catdir/bios/wiley047/89024853.html</dc:Identifier>
<dc:Identifier>http://www.loc.gov/catdir/description/wiley031/89024853.html</dc:Identifier>
<dc:Identifier>http://www.loc.gov/catdir/toc/onix01/89024853.html</dc:Identifier>
<dc:Language>eng</dc:Language>
<dc:Relation>Wiley series in probability and mathematical statistics. Applied probability and statistics</dc:Relation>

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