01273cam a22003497a 4500 13910153 BD-DhUL 20140819092844.0 050324s2005 nyua b 001 0 eng d 2005924717 9780387258000 0387258000 (OCoLC)ocm61714990 OHX OHX UAB IXA DLC BD-DhUL lccopycat QH212.E4 E354 2005 QC lcco 502.825 EGP Egerton, R. F. Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / by Ray F. Egerton. New York : Springer, c2005. xii, 202 p. : ill. ; 25 cm. US$ 98.50 Includes bibliographical references and index. Electron microscopy. Table of contents http://www.loc.gov/catdir/toc/fy0605/2005924717.html Publisher description http://www.loc.gov/catdir/enhancements/fy0663/2005924717-d.html 7 cbc copycat 2 ncip 20 y-gencatlg ddc BK jb11 2006-02-14 z-processor jb11 2006-02-14; to subj. ja15 2006-04-27 copy 2 added pc20 2005-03-24 jb00 2006-02-10 jp00 2006-03-13 3838 3838 0 0 ddc 0 502_825000000000000_EGP 0 NFIC 7004 DUSL DUSL GEN 2013-01-03 Purchased 502.825 EGP 473946 2014-08-19 1 2014-08-19 BK 0 0 ddc 0 502_825000000000000_EGP 0 NFIC 7006 DUSL DUSL GEN 2013-01-03 Purchased 502.825 EGP 473947 2014-08-19 2 2014-08-19 BK