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  xmlns:dcterms="http://purl.org/dc/terms/"><dc:Title>Scanning and transmission electron microscopy : an introduction / by Stanley L. Flegler, John W. Heckman, Jr. and Karen L. Klomparens.</dc:Title>
<dc:Creator>Flegler, Stanley L.</dc:Creator>
<dc:Creator>Heckman, John William.</dc:Creator>
<dc:Creator>Klomparens, Karen L.</dc:Creator>
<dc:Subject>Scanning electron microscopy.</dc:Subject>
<dc:Subject>Transmission electron microscopy.</dc:Subject>
<dc:Subject>QH212.S3 F58 1995</dc:Subject>
<dc:Subject>502.825 20 FLS</dc:Subject>
<dc:Description>Originally published: New York : W.H. Freeman, c1993.</dc:Description>
<dc:Description>Includes bibliographical references and index.</dc:Description>
<dc:Publisher>New York : Oxford University Press,</dc:Publisher>
<dc:Date>1993.</dc:Date>
<dc:Date>1993.</dc:Date>
<dc:Date>1995</dc:Date>
<dc:Type>Text</dc:Type>
<dc:Format>viii, 225 p. :</dc:Format>
<dc:Identifier>http://www.loc.gov/catdir/enhancements/fy0603/95039017-d.html</dc:Identifier>
<dc:Identifier>http://www.loc.gov/catdir/enhancements/fy0603/95039017-t.html</dc:Identifier>
<dc:Identifier>http://www.loc.gov/catdir/enhancements/fy0723/95039017-b.html</dc:Identifier>
<dc:Language>eng</dc:Language>

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