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  <titleInfo>
    <title>Computer automation of materials testing</title>
    <subTitle>a symposium</subTitle>
  </titleInfo>
  <name type="personal">
    <namePart>Wonsiewicz, B. C.</namePart>
    <role>
      <roleTerm authority="marcrelator" type="text">creator</roleTerm>
    </role>
  </name>
  <name type="corporate">
    <namePart>ASTM Committee E-24 on Fracture Testing</namePart>
  </name>
  <name type="corporate">
    <namePart>American Society for Testing and Materials</namePart>
    <namePart>Committee E-28 on Mechanical Testing.</namePart>
  </name>
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  <genre authority="marc">conference publication</genre>
  <originInfo>
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    </place>
    <place>
      <placeTerm type="text">Philadelphia, Pa</placeTerm>
    </place>
    <publisher>ASTM</publisher>
    <dateIssued>c1980</dateIssued>
    <dateIssued encoding="marc">1980</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <language>
    <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
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  <physicalDescription>
    <form authority="marcform">print</form>
    <extent>224 p. : ill. ; 24 cm.</extent>
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  <note type="statement of responsibility">sponsored by ASTM Committee E-24 on Fracture Testing and Committee E-28 on Mechanical Testing, American Society for Testing and Materials, Philadelphia, Pa., 5-11 Nov. 1978 ; B.C. Wonsiewicz, editor.</note>
  <note>Includes bibliographical references and index.</note>
  <subject authority="lcsh">
    <topic>Materials</topic>
    <topic>Testing</topic>
    <topic>Data processing</topic>
    <topic>Congresses</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Materials</topic>
    <topic>Testing</topic>
    <topic>Automation</topic>
    <topic>Congresses</topic>
  </subject>
  <classification authority="lcc">TA410 .C54</classification>
  <classification authority="ddc" edition="19">620.1 WOC</classification>
  <relatedItem type="series">
    <titleInfo>
      <title>ASTM special technical publication ; 710</title>
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  <identifier type="isbn"/>
  <identifier type="lccn">79056322</identifier>
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