01110pam a2200277 a 45000010008000000030008000080050017000160080041000330100017000740200015000910400026001060500023001320820019001552450178001742600039003523000036003914400073004275040053005006500051005536500056006046500054006606500039007146500037007537000020007907000022008101423963BD-DhUL20150118182845.0840517s1984    nyua     b    101 0 eng    a   84010244   a0444009035  aBD-DhULcBD-DhULdDLC00aTA418.6b.E54 198400a620.1228bS98900aEnergy beam-solid interactions and transient thermal processing :bsymposium held November 1983 in Boston, Massachusetts, U.S.A. /ceditors, John C.C. Fan, Noble M. Johnson.  aNew York :bNorth-Holland,cc1984.  axviii, 791 p. :bill. ;c24 cm. 0aMaterials Research Society symposia proceedings,x0272-9172 ;vv. 23  aIncludes bibliographical references and indexes. 0aMaterialsxEffect of radiation onxCongresses. 0aSemiconductorsxEffect of radiation onxCongresses. 0aSemiconductor industryxLaser use inxCongresses. 0aAnnealing of crystalsxCongresses. 0aIntegrated circuitsxCongresses.1 aFan, John C. C.1 aJohnson, Noble M.