TY  - BOOK
AU  - Sirohi, R. S.
TI  - Speckle metrology
T2  - Optical engineering
SN  - 0824789326
AV  - TA417.2 .S66 1993
U1  - 620.1127 20
PY  - 1993///
CY  - New York
PB  - Dekker
KW  - Nondestructive testing
KW  - Speckle metrology
N1  - Includes bibliographical references and index
ER  -