00809pam a2200277 a 4500 1577077 BD-DhUL 20150504092652.0 930225s1993 nyua b 001 0 eng 93000734 0824789326 BD-DhUL BD-DhUL DLC TA417.2 .S66 1993 620.1127 20 SPE Speckle metrology / edited by Rajpal S. Sirohi. New York : Dekker, c1993. xiii, 551 p. : ill. ; 24 cm. USD 210.00 Optical engineering ; 38 Includes bibliographical references and index. Nondestructive testing. Speckle metrology. Sirohi, R. S. ed. Optical engineering ; v. 38. ddc BK 33009 33009 0 0 ddc 0 620_112700000000000_SPE 0 NFIC 61839 DUSL DUSL GEN 2015-01-18 purchased 620.1127 SPE 371795 2015-01-18 2015-01-18 BK