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    <subfield code="a">Ghallab, Yehya H.</subfield>
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    <subfield code="a">Lab-on-a-chip :</subfield>
    <subfield code="b">techniques, circuits, and biomedical applications /</subfield>
    <subfield code="c">Yahya H. Ghallab, Wael Badawy</subfield>
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    <subfield code="a">Includes bibliographic references and index.</subfield>
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    <subfield code="g">1.</subfield>
    <subfield code="t">Introduction to Lab-on-a-Chip -- </subfield>
    <subfield code="g">1.1.</subfield>
    <subfield code="t">History -- </subfield>
    <subfield code="g">1.2.</subfield>
    <subfield code="t">Parts and Components of Lab-on-a-Chip -- </subfield>
    <subfield code="g">1.2.1.</subfield>
    <subfield code="t">Electric and Magnetic Actuators -- </subfield>
    <subfield code="g">1.2.2.</subfield>
    <subfield code="t">Electrical Sensors -- </subfield>
    <subfield code="g">1.2.3.</subfield>
    <subfield code="t">Thermal Sensors -- </subfield>
    <subfield code="g">1.2.4.</subfield>
    <subfield code="t">Optical Sensors -- </subfield>
    <subfield code="g">1.2.5.</subfield>
    <subfield code="t">Microfluidic Chambers -- </subfield>
    <subfield code="g">1.3.</subfield>
    <subfield code="t">Applications of Lab-on-a-Chip -- </subfield>
    <subfield code="g">1.4.</subfield>
    <subfield code="t">Advantages and Disadvantages of Lab-on-a-Chip -- </subfield>
    <subfield code="t">References -- </subfield>
    <subfield code="g">2.</subfield>
    <subfield code="t">Cell Structure, Properties, and Models -- </subfield>
    <subfield code="g">2.1.</subfield>
    <subfield code="t">Cell Structure -- </subfield>
    <subfield code="g">2.1.1.</subfield>
    <subfield code="t">Prokaryotic Cells -- </subfield>
    <subfield code="g">2.1.2.</subfield>
    <subfield code="t">Eukaryotic Cells -- </subfield>
    <subfield code="g">2.1.3.</subfield>
    <subfield code="t">Cell Components -- </subfield>
    <subfield code="g">2.2.</subfield>
    <subfield code="t">Electromechanics of Particles -- </subfield>
    <subfield code="g">2.2.1.</subfield>
    <subfield code="t">Single-Layer Model -- </subfield>
    <subfield code="g">2.2.2.</subfield>
    <subfield code="t">Double-Layer Model -- </subfield>
    <subfield code="g">2.3.</subfield>
    <subfield code="t">Electrogenic Cells -- </subfield>
    <subfield code="g">2.3.1.</subfield>
    <subfield code="t">Neurons -- </subfield>
    <subfield code="g">2.3.2.</subfield>
    <subfield code="t">Gated Ion Channels -- </subfield>
    <subfield code="g">2.3.3.</subfield>
    <subfield code="t">Action Potential -- </subfield>
    <subfield code="t">References -- </subfield>
    <subfield code="g">3.</subfield>
    <subfield code="t">Cell Manipulator Fields -- </subfield>
    <subfield code="g">3.1.</subfield>
    <subfield code="t">Electric Field -- </subfield>
    <subfield code="g">3.1.1.</subfield>
    <subfield code="t">Uniform Electric Field (Electrophoresis) -- </subfield>
    <subfield code="g">3.1.2.</subfield>
    <subfield code="t">Nonuniform Electric Field (Dielectrophoresis) -- </subfield>
    <subfield code="g">3.2.</subfield>
    <subfield code="t">Magnetic Field -- </subfield>
    <subfield code="g">3.2.1.</subfield>
    <subfield code="t">Nonuniform Magnetic Field (Magnetophoresis) -- </subfield>
    <subfield code="g">3.2.2.</subfield>
    <subfield code="t">Magnetophoresis Force (MAP Force) -- </subfield>
    <subfield code="t">References -- </subfield>
    <subfield code="g">4.</subfield>
    <subfield code="t">Metal-Oxide Semiconductor (MOS) Technology Fundamentals -- </subfield>
    <subfield code="g">4.1.</subfield>
    <subfield code="t">Semiconductor Properties -- </subfield>
    <subfield code="g">4.2.</subfield>
    <subfield code="t">Intrinsic Semiconductors -- </subfield>
    <subfield code="g">4.3.</subfield>
    <subfield code="t">Extrinsic Semiconductor -- </subfield>
    <subfield code="g">4.3.1.</subfield>
    <subfield code="t">N-Type Doping -- </subfield>
    <subfield code="g">4.3.2.</subfield>
    <subfield code="t">P-Type Doping -- </subfield>
    <subfield code="g">4.4.</subfield>
    <subfield code="t">MOS Device Physics -- </subfield>
    <subfield code="g">4.5.</subfield>
    <subfield code="t">MOS Characteristics -- </subfield>
    <subfield code="g">4.5.1.</subfield>
    <subfield code="t">Modes of Operation -- </subfield>
    <subfield code="g">4.6.</subfield>
    <subfield code="t">Complementary Metal-Oxide Semiconductor (CMOS) Device -- </subfield>
    <subfield code="g">4.6.1.</subfield>
    <subfield code="t">Advantages of CMOS Technology -- </subfield>
    <subfield code="t">References -- </subfield>
    <subfield code="g">5.</subfield>
    <subfield code="t">Sensing Techniques for Lab-on-a-Chip -- </subfield>
    <subfield code="g">5.1.</subfield>
    <subfield code="t">Optical Technique -- </subfield>
    <subfield code="g">5.2.</subfield>
    <subfield code="t">Fluorescent Labeling Technique -- </subfield>
    <subfield code="g">5.3.</subfield>
    <subfield code="t">Impedance Sensing Technique -- </subfield>
    <subfield code="g">5.4.</subfield>
    <subfield code="t">Magnetic Field Sensing Technique -- </subfield>
    <subfield code="g">5.5.</subfield>
    <subfield code="t">CMOS AC Electrokinetic Microparticle Analysis System -- </subfield>
    <subfield code="g">5.5.1.</subfield>
    <subfield code="t">Bioanalysis Platform -- </subfield>
    <subfield code="g">5.5.2.</subfield>
    <subfield code="t">Experimental Tests -- </subfield>
    <subfield code="t">References -- </subfield>
    <subfield code="g">6.</subfield>
    <subfield code="t">CMOS-Based Lab-on-a-Chip -- </subfield>
    <subfield code="g">6.1.</subfield>
    <subfield code="t">PCB Lab-on-a-Chip for Micro-Organism Detection and Characterization -- </subfield>
    <subfield code="g">6.2.</subfield>
    <subfield code="t">Actuation -- </subfield>
    <subfield code="g">6.3.</subfield>
    <subfield code="t">Impedance Sensing -- </subfield>
    <subfield code="g">6.4.</subfield>
    <subfield code="t">CMOS Lab-on-a-Chip for Micro-Organism Detection and Manipulation -- </subfield>
    <subfield code="g">6.5.</subfield>
    <subfield code="t">CMOS Lab-on-a-Chip for Neuronal Activity Detection -- </subfield>
    <subfield code="g">6.6.</subfield>
    <subfield code="t">CMOS Lab-on-a-Chip for Cytometry Applications -- </subfield>
    <subfield code="g">6.7.</subfield>
    <subfield code="t">Flip-Chip Integration -- </subfield>
    <subfield code="t">References -- </subfield>
    <subfield code="g">7.</subfield>
    <subfield code="t">CMOS Electric-Field-Based Lab-on-a-Chip for Cell Characterization and Detection -- </subfield>
    <subfield code="g">7.1.</subfield>
    <subfield code="t">Design Flow -- </subfield>
    <subfield code="g">7.2.</subfield>
    <subfield code="t">Actuation -- </subfield>
    <subfield code="g">7.3.</subfield>
    <subfield code="t">Electrostatic Simulation -- </subfield>
    <subfield code="g">7.4.</subfield>
    <subfield code="t">Sensing -- </subfield>
    <subfield code="g">7.5.</subfield>
    <subfield code="t">The Electric Field Sensitive Field Effect Transistor (eFET) -- </subfield>
    <subfield code="g">7.6.</subfield>
    <subfield code="t">The Differential Electric Field Sensitive Field Effect Transistor (DeFET) -- </subfield>
    <subfield code="g">7.7.</subfield>
    <subfield code="t">DeFET Theory of Operation -- </subfield>
    <subfield code="g">7.8.</subfield>
    <subfield code="t">Modeling the DeFET -- </subfield>
    <subfield code="g">7.8.1.</subfield>
    <subfield code="t">A Simple DC Model -- </subfield>
    <subfield code="g">7.8.2.</subfield>
    <subfield code="t">SPICE DC Equivalent Circuit -- </subfield>
    <subfield code="g">7.8.3.</subfield>
    <subfield code="t">AC Equivalent Circuit -- </subfield>
    <subfield code="g">7.9.</subfield>
    <subfield code="t">The Effect of the DeFET on the Applied Electric Field Profile -- </subfield>
    <subfield code="t">References -- </subfield>
    <subfield code="g">8.</subfield>
    <subfield code="t">Prototyping and Experimental Analysis -- </subfield>
    <subfield code="g">8.1.</subfield>
    <subfield code="t">Testing the DeFET -- </subfield>
    <subfield code="g">8.1.1.</subfield>
    <subfield code="t">The DC Response -- </subfield>
    <subfield code="g">8.1.2.</subfield>
    <subfield code="t">The AC (Frequency) Response -- </subfield>
    <subfield code="g">8.1.3.</subfield>
    <subfield code="t">Other Features of the DeFET -- </subfield>
    <subfield code="g">8.2.</subfield>
    <subfield code="t">Noise Analysis -- </subfield>
    <subfield code="g">8.2.1.</subfield>
    <subfield code="t">Noise Sources -- </subfield>
    <subfield code="g">8.2.2.</subfield>
    <subfield code="t">Noise Measurements -- </subfield>
    <subfield code="g">8.3.</subfield>
    <subfield code="t">The Effect of Temperature and Light on DeFET Performance -- </subfield>
    <subfield code="g">8.4.</subfield>
    <subfield code="t">Testing the Electric Field Imager -- </subfield>
    <subfield code="g">8.4.1.</subfield>
    <subfield code="t">The Response of the Imager Under Different Environments -- </subfield>
    <subfield code="g">8.4.2.</subfield>
    <subfield code="t">Testing the Imager with Biocells -- </subfield>
    <subfield code="g">8.5.</subfield>
    <subfield code="t">Packaging the Lab-on-a-Chip -- </subfield>
    <subfield code="t">References -- </subfield>
    <subfield code="g">9.</subfield>
    <subfield code="t">Readout Circuits for Lab-on-a-Chip -- </subfield>
    <subfield code="g">9.1.</subfield>
    <subfield code="t">Current-Mode Circuits -- </subfield>
    <subfield code="g">9.2.</subfield>
    <subfield code="t">Operational Floating Current Conveyor (OFCC) -- </subfield>
    <subfield code="g">9.2.1.</subfield>
    <subfield code="t">A Simple Model -- </subfield>
    <subfield code="g">9.2.2.</subfield>
    <subfield code="t">OFCC with Feedback -- </subfield>
    <subfield code="g">9.3.</subfield>
    <subfield code="t">Current-Mode Instrumentation Amplifier -- </subfield>
    <subfield code="g">9.3.1.</subfield>
    <subfield code="t">Current-Mode Instrumentation Amplifier (CMIA) Based on CCII -- </subfield>
    <subfield code="g">9.3.2.</subfield>
    <subfield code="t">Current-Mode Instrumentation Amplifier Based on OFCC -- </subfield>
    <subfield code="g">9.4.</subfield>
    <subfield code="t">Experimental and Simulation Results of the Proposed CMIA -- </subfield>
    <subfield code="g">9.4.1.</subfield>
    <subfield code="t">The Differential Gain Measurements -- </subfield>
    <subfield code="g">9.4.2.</subfield>
    <subfield code="t">Common-Mode Rejection Ratio Measurements -- </subfield>
    <subfield code="g">9.4.3.</subfield>
    <subfield code="t">Other Features of the Proposed CMIA -- </subfield>
    <subfield code="g">9.4.4.</subfield>
    <subfield code="t">Noise Results -- </subfield>
    <subfield code="g">9.5.</subfield>
    <subfield code="t">Comparison Between Different CMIAs -- </subfield>
    <subfield code="g">9.6.</subfield>
    <subfield code="t">Testing the Readout Circuit with the Electric Field Based Lab-on-a-Chip -- </subfield>
    <subfield code="t">References -- </subfield>
    <subfield code="g">10.</subfield>
    <subfield code="t">Current-Mode Wheatstone Bridge for Lab-on-a-Chip Applications -- </subfield>
    <subfield code="g">10.1.</subfield>
    <subfield code="t">Introduction -- </subfield>
    <subfield code="g">10.2.</subfield>
    <subfield code="t">CMWB Based on Operational Floating Current Conveyor -- </subfield>
    <subfield code="g">10.3.</subfield>
    <subfield code="t">A Linearization Technique Based on an Operational Floating Current Conveyor -- </subfield>
    <subfield code="g">10.4.</subfield>
    <subfield code="t">Experimental and Simulation Results -- </subfield>
    <subfield code="g">10.4.1.</subfield>
    <subfield code="t">The Differential Measurements -- </subfield>
    <subfield code="g">10.4.2.</subfield>
    <subfield code="t">Common-Mode Measurements -- </subfield>
    <subfield code="g">10.5.</subfield>
    <subfield code="t">Discussion -- </subfield>
    <subfield code="t">References -- </subfield>
    <subfield code="g">11.</subfield>
    <subfield code="t">Current-Mode Readout Circuits for the pH Sensor -- </subfield>
    <subfield code="g">11.1.</subfield>
    <subfield code="t">Introduction -- </subfield>
    <subfield code="g">11.2.</subfield>
    <subfield code="t">Differential ISFET-Based pH Sensor -- </subfield>
    <subfield code="g">11.2.1.</subfield>
    <subfield code="t">ISFET-Based pH Sensor -- </subfield>
    <subfield code="g">11.2.2.</subfield>
    <subfield code="t">Differential ISFET Sensor -- </subfield>
    <subfield code="g">11.3.</subfield>
    <subfield code="t">pH Readout Circuit Based on an Operational Floating Current Conveyor -- </subfield>
    <subfield code="g">11.3.1.</subfield>
    <subfield code="t">Simulation Results -- </subfield>
    <subfield code="g">11.4.</subfield>
    <subfield code="t">pH Readout Circuit Using Only Two Operational Floating Current Conveyors -- </subfield>
    <subfield code="g">11.4.1.</subfield>
    <subfield code="t">Simulation Results -- </subfield>
    <subfield code="t">References.</subfield>
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