01395mam a22003135a 45000010008000000030008000080050017000160080041000330100017000740150015000910200032001060350023001380400032001610820018001931110105002112450345003162600050006612630009007113000032007203650015007525040051007676500044008186500048008626500064009106530028009746530048010027000018010507000013010681101544BD-DhUL20150115144446.0910814s1991    enka          000 0 eng d  agb 91089031   aGB91-89031  a0750301686 (pbk) :c£42.00  a(OCoLC)ocm24755251  aUKMcUKMdAZUdNNCdBD-DhUL14a621.3815bINS2 aBiennial European Insulating Films On Semiconductors Conferencen(7th :d1991 :cLiverpool, England)10aInsulating films on semiconductors 1991 :bproceedings from the 7th biennial european conference, including satellite workshops on silicon on insulator: materials and device technology and the physics of hot electron degradation in Si MOSFETs held at the University of Liverpool, 2nd to 6th April 1991 /cEdited by W. Eccleston and M. Uren.  bAdam Hilger,cc1991.aBristol, Philadelphia :  a9109  ax, 344 p. :bill. ;c24 cm.  aGBPb54.00  aIncludes bibliographical references and index. 0aMetal oxide semiconductorsvCongresses. 0aMetal insulator semiconductorsvCongresses. 0aElectric insulators and insulationxThin filmsvCongresses.  aProperties of materials  aElectricity, magnetism and electromagnetism1 aEccleston, W.1 aUren, M.