<?xml version="1.0" encoding="UTF-8"?>
<metadata
  xmlns="http://example.org/myapp/"
  xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"
  xsi:schemaLocation="http://example.org/myapp/ http://example.org/myapp/schema.xsd"
  xmlns:dc="http://purl.org/dc/elements/1.1/"
  xmlns:dcterms="http://purl.org/dc/terms/"><dc:Title>Design of systems and circuits for maximum reliability or maximum production yield / Peter W. Becker, Finn Jensen.</dc:Title>
<dc:Creator>Becker, Peter W.</dc:Creator>
<dc:Creator>Jensen, Finn. 1937- joint author.</dc:Creator>
<dc:Subject>Electronic circuit design Data processing.</dc:Subject>
<dc:Subject>Electronic systems Design and construction Data processing.</dc:Subject>
<dc:Subject>Electronic apparatus and appliances Reliability Data processing.</dc:Subject>
<dc:Subject>TK7867 .B36 1977</dc:Subject>
<dc:Subject>621.38153 BED</dc:Subject>
<dc:Description>Bibliography: p. 281-289.</dc:Description>
<dc:Publisher>New York : McGraw-Hill,</dc:Publisher>
<dc:Date>c1977.</dc:Date>
<dc:Date>c1977.</dc:Date>
<dc:Date>1977</dc:Date>
<dc:Type>Text</dc:Type>
<dc:Format>xiv, 293 p. :</dc:Format>
<dc:Language>eng</dc:Language>

</metadata>