01498cam a2200385 a 4500 13936063 BD-DhUL 20150115143650.0 050420s2006 njua b 001 0 eng 2005048514 GBA573304 bnb 013282982 Uk 0471739065 (acidfree paper) 9780471739067 (OCoLC)ocm59360243 DLC DLC BAKER UKM C#P DLC BD-DhUL QC611 .S335 2006 621.38152 SCS Schroder, Dieter K. Semiconductor material and device characterization / Dieter K. Schroder. 3rd ed. [Piscataway : Wiley, c2006. xv, 779 p. : ill. ; 24 cm. GBP. 70.15 "Wiley-Interscience." Includes bibliographical references and index. Semiconductors. Semiconductors Testing. Publisher description http://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html Table of contents only http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html Contributor biographical information http://www.loc.gov/catdir/enhancements/fy0654/2005048514-b.html 7 cbc orignew 1 ocip 20 y-gencatlg ddc BK pc12 2005-04-20 to ASCD jp18 2005-04-21 to SL aa01 2005-04-21 ps10 2006-03-02 bk rec'd, to CIP ver. pv12 2006-08-09 copy 2 to BCCD 31652 31652 0 0 ddc 0 621_381520000000000_SCS 0 FIC 59672 DUSL DUSL GEN 2007-12-02 Purchased 621.38152 SCS 423674 2015-01-15 2015-01-15 BK