TY  - BOOK
AU  - Schroder, Dieter K.
TI  - Semiconductor material and device characterization
SN  - 0471241393
AV  - QC611 .S335 1998
U1  - 621.38152 21
PY  - 1998///
CY  - New York
PB  - Wiley
KW  - Semiconductors
KW  - Testing
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/bios/wiley047/97052094.html
UR  - http://www.loc.gov/catdir/description/wiley032/97052094.html
UR  - http://www.loc.gov/catdir/toc/onix02/97052094.html
ER  -