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  xmlns:dcterms="http://purl.org/dc/terms/"><dc:Title>Design of testable logic circuits / R.G. Bennetts.</dc:Title>
<dc:Creator>Bennetts, R. G.</dc:Creator>
<dc:Subject>Logic circuits.</dc:Subject>
<dc:Subject>Logic circuits Testing.</dc:Subject>
<dc:Subject>TK7868.L6 B45 1984</dc:Subject>
<dc:Subject>621.381537 19 B 471d</dc:Subject>
<dc:Description>Includes bibliographies and index.</dc:Description>
<dc:Publisher>London ; Reading, Mass. : Addison-Wesley Pub. Co.,</dc:Publisher>
<dc:Date>c1984.</dc:Date>
<dc:Date>c1984.</dc:Date>
<dc:Date>1984</dc:Date>
<dc:Type>Text</dc:Type>
<dc:Format>xii, 164 p. :</dc:Format>
<dc:Language>eng</dc:Language>
<dc:Relation>Microelectronics systems design series</dc:Relation>

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