Fault covering problems in reconfigurable VLSI systems / by Ran Libeskind-Hadas ... [et al.]. Libeskind-Hadas, Ran. Integrated circuits Very large scale integration Design and construction Data processing. Integrated circuits Wafer-scale integration Design and construction Data processing. Integrated circuits Fault tolerance. TK7874 .F38 1992 621.395 20 FAU Includes bibliographical references (p. 119-127) and index. Boston : Kluwer, c1992. c1992. 1992 Text xiii, 130 p. : http://www.loc.gov/catdir/enhancements/fy0821/92004369-d.html http://www.loc.gov/catdir/enhancements/fy0821/92004369-t.html eng The Kluwer international series in engineering and computer science ; SECS 172. VLSI, computer architecture, and digital signal processing Kluwer international series in engineering and computer science ; SECS 172. Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.