atomic force microscopy and scanning tunneling microscopy Voigtländer, Bert. creator text gw 2015 monographic eng xv, 382 p. : ill. (some col.) ; 24 cm. This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. Bert Voigtländer. Includes bibliographical references and index. Microscopies Materials science 502.82 VOS (DLC) 2014958892 9783662452394 (hbk) 2019766493 DLC 150224 20210620110814.0 21820786 eng