02211cam a22004815i 4500 21820786 BD-DhUL 20210620110814.0 m |o d | cr ||||||||||| 150224s2015 gw |||| o |||| 0|eng 2019766493 9783662452394 (hbk) 10.1007/978-3-662-45240-0 doi (DE-He213)978-3-662-45240-0 DLC eng pn rda DLC BD-DhUL TBN bicssc TBN thema TEC027000 bisacsh 502.82 VOS 23 Voigtländer, Bert. Scanning Probe Microscopy : atomic force microscopy and scanning tunneling microscopy / Bert Voigtländer. Berlin, Heidelberg : Springer, 2015. xv, 382 p. : ill. (some col.) ; 24 cm. text txt rdacontent computer c rdamedia online resource cr rdacarrier text file PDF rda Euro 129.99 Nanoscience and technology Includes bibliographical references and index. This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. Description based on publisher-supplied MARC data. Microscopies. Materials science Print version: Scanning probe microscopy. 9783662452394 (DLC) 2014958892 Printed edition: 9783662452394 Printed edition: 9783662452417 Printed edition: 9783662505571 NanoScience and Technology, 1434-4904 0 ibc origres u ncip 20 y-gencatlg ddc BK 254070 254070 0 0 ddc 0 502_820000000000000_VOS 0 NFIC 387713 DUSL DUSL GEN 2020-10-04 Purchased 502.82 VOS 518017 2021-06-20 1 2021-06-20 BK Physics 0 0 ddc 0 502_820000000000000_VOS 0 NFIC 387714 DUSL DUSL GEN 2020-10-04 Purchased 502.82 VOS 518018 2021-06-20 2 2021-06-20 BK tr. to Physics dept.