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  <titleInfo>
    <title>Magnetism of surfaces, interfaces, and nanoscale materials : Vol. 5</title>
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  <name type="personal">
    <namePart>Camley, Robert E.</namePart>
  </name>
  <name type="personal">
    <namePart>Celinski, Zbigniew.</namePart>
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  <name type="personal">
    <namePart>Stamps, Robert L.</namePart>
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    <place>
      <placeTerm type="text">Amsterdam</placeTerm>
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    <publisher>Elsevier</publisher>
    <dateIssued>�2016</dateIssued>
    <dateIssued encoding="marc">2016</dateIssued>
    <issuance>monographic</issuance>
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    <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
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  <abstract>In the past 30 years, magnetic research has been dominated by the question of how surfaces and interfaces influence the magnetic and transport properties of nanostructures, thin films and multilayers. The research has been particularly important in the magnetic recording industry where the giant magnetoresistance effect led to a new generation of storage devices including hand-held memories such as those found in the ipod. More recently, transfer of spin angular momentum across interfaces has opened a new field for high frequency applications. This book gives a comprehensive view of research at the forefront of these fields. The frontier is expanding through dynamic exchange between theory and experiment. Contributions have been chosen to reflect this, giving the reader a unified overview of the topic.</abstract>
  <tableOfContents>""Front Cover""; ""Magnetism of Surfaces, Interfaces, and Nanoscale Materials""; ""Copyright""; ""Contents""; ""Contributors""; ""Preface""; ""Chapter 1: Growth and Characterization of Magnetic Thin Film and Nanostructures""; ""1. Introduction""; ""2. Thin-Film Growth""; ""2.1. Thermal and Electron Beam Evaporation""; ""2.2. Sputter Deposition""; ""2.2.1. DC Sputter Deposition""; ""2.2.2. RF Sputter Deposition""; ""2.2.3. Magnetron Sputter Deposition""; ""3. Characterization Techniques""; ""3.1. Surface Characterization""; ""3.1.1. Atomic Force Microscopy""</tableOfContents>
  <tableOfContents>""3.1.2. Magnetic Force Microscopy""""3.2. Static Magnetic Characterization""; ""3.2.1. MOKE Spectroscopy""; ""3.2.2. Vibrating Sample Magnetometry""; ""3.3. Dynamic Magnetic Characterization""; ""3.3.1. FMR Spectroscopy""; ""3.3.2. BLS Spectroscopy""; ""4. Magnetic Nanostructures""; ""4.1. Lithography""; ""4.2. Pattern Transfer""; ""4.3. Practical Examples""; ""4.3.1. Planar Magnetic Nanostructures""; ""4.3.2. Thickness-Modulated Magnetic Nanostructures""; ""4.3.3. Bicomponent Magnetic Nanostructures""; ""5. Conclusion""; ""Acknowledgments""; ""References""</tableOfContents>
  <tableOfContents>""Chapter 2: Element-Specific Probes of Magnetism""""1. Introduction""; ""2. Fundamental Aspects of Optical Excitation""; ""2.1. Electronic States in Solids""; ""2.2. Spectroscopy of Core States""; ""2.3. X-Ray Photoemission Spectroscopy""; ""2.4. X-Ray Absorption Spectroscopy""; ""2.5. X-Ray Reflection Spectroscopy""; ""3. Spin-Sensitive Photoemission""; ""3.1. Core-Level Photoemission from Ferromagnets""; ""3.1.1. Spin Polarimeter Schemes""; ""3.1.2. 3s XPS""; ""3.1.3. 2p XPS""; ""3.2. Magnetic Dichroism in Photoemission""; ""3.2.1. Magnetic Circular Dichroism in Photoemission""</tableOfContents>
  <tableOfContents>""3.2.2. Role of Angular Selection in Photoemission""""4. Magnetic Dichroism in X-Ray Absorption""; ""4.1. Magnetic X-Ray Circular Dichroism""; ""4.2. Magnetic X-Ray Linear Dichroism""; ""4.3. Hybrid Systems""; ""5. Magnetic Resonant X-Ray Scattering""; ""5.1. Basic Aspects""; ""5.2. Complex Layered Structures""; ""5.3. Antiferromagnets""; ""6. Addressing Picosecond Magnetization Dynamics""; ""7. Ultrafast Demagnetization Dynamics""; ""8. Summary and Conclusions""; ""Acknowledgments""; ""References""; ""Chapter 3: Magnetization Dynamics""; ""1. Introduction""; ""2. Analytic Results""</tableOfContents>
  <tableOfContents>""2.1. Infinitely Extended Flat Plate: In-Plane Field""""2.2. Spin Waves Propagating Perpendicular to the Surface, Conducting Films""; ""2.3. Surface Modes for Spin Waves Propagating Parallel to the Film Surface""; ""2.4. Infinitely Extended Flat Plate-Perpendicular-to-Plane Magnetization""; ""2.5. Nanostructures""; ""2.6. Antiferromagnets""; ""3. Examples of Experimental Characterization of Ferromagnetic Samples""; ""4. FMR Techniques""; ""4.1. Magnetic Damping""; ""4.2. Broadband FMR-Frequency Swept""; ""4.3. Broadband FMR-Field Swept""; ""4.3.1. Multimode Cavity Configuration""</tableOfContents>
  <note type="statement of responsibility">edited by Robert E. Camley, Zbigniew Celinski, Robert L. Stamps.</note>
  <note>Includes bibliographical references and index.</note>
  <subject authority="lcsh">
    <topic>Magnetic materials</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Thin films</topic>
    <topic>Surfaces</topic>
    <topic>Magnetic properties</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Interfaces (Physical sciences)</topic>
  </subject>
  <subject authority="bisacsh">
    <topic>SCIENCE</topic>
    <topic>Physics</topic>
    <topic>Magnetism</topic>
  </subject>
  <subject authority="fast">
    <topic>Interfaces (Physical sciences)</topic>
  </subject>
  <subject authority="fast">
    <topic>Magnetic materials</topic>
  </subject>
  <subject authority="fast">
    <topic>Thin films</topic>
    <topic>Surfaces</topic>
    <topic>Magnetic properties</topic>
  </subject>
  <subject authority="hilcc">
    <topic>Electrical Engineering</topic>
  </subject>
  <subject authority="hilcc">
    <topic>Electrical &amp; Computer Engineering</topic>
  </subject>
  <subject authority="hilcc">
    <topic>Engineering &amp; Applied Sciences</topic>
  </subject>
  <classification authority="lcc">QC765</classification>
  <classification authority="ddc" edition="23">538.4</classification>
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      <title>Magnetism of Surfaces, Interfaces, and Nanoscale Materials</title>
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    <name>
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    <originInfo>
      <publisher>Saint Louis : Elsevier Science, �2015</publisher>
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      <title>Handbook of surface science ; v. 5</title>
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