Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Servín, Manuel
creator
author.
Quiroga, J. Antonio (Juan Antonio)
author.
Padilla, J. Moisés (José Moisés)
author.
text
bibliography
Electronic books.
Electronic books.
gw
2014
2014
First edition.
monographic
eng
1 online resource (xvi, 328 pages) : illustrations
Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla.
Edition statement from running title area.
Includes bibliographical references and index.
Interferometry
Diffraction patterns
Optical measurements
SCIENCE
Energy
SCIENCE
Mechanics
General
SCIENCE
Physics
General
Diffraction patterns
Interferometry
Optical measurements
Interferometrie
Beugungsfigur
QC39 .S384 2014
530.8
Fringe pattern analysis for optical metrology
Servín, Manuel.
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, [2014]
(OCoLC)884739610
1306840880
9781306840880
9783527681082
3527681086
3527411526
9783527411528
9783527681105 (ePub)
3527681108 (ePub)
615339 MIL
http://onlinelibrary.wiley.com/book/10.1002/9783527681075
http://onlinelibrary.wiley.com/book/10.1002/9783527681075
IDEBK
140606
20171030094832.0
ocn881028799
eng