03181cam a2200829Ii 4500 ocn881028799 OCoLC 20171030094832.0 m o d cr |n||||||||| 140606t20142014gw a ob 001 0 eng d 1306840880 (electronic bk.) 9781306840880 (electronic bk.) 9783527681082 (electronic bk.) 3527681086 (electronic bk.) 9783527681075 3527681078 9783527681099 3527681094 9783527411528 (print) 3527411526 9783527411528 9783527681105 (ePub) 3527681108 (ePub) NZ1 15592168 CHVBK 334095115 CHBIS 010442065 DEBSZ 431698449 CHVBK 327497866 CHDSB 006324887 DEBBG BV042989765 DEBBG BV043396841 (OCoLC)881028799 (OCoLC)890067315 (OCoLC)908035721 615339 MIL IDEBK eng rda pn IDEBK EBLCP E7B DG1 CUI N$T OCLCA OCLCQ OCLCF DEBSZ COO YDXCP CHVBK DEBBG RECBK MAIN QC39 .S384 2014 SCI 024000 bisacsh SCI 041000 bisacsh SCI 055000 bisacsh 530.8 Servín, Manuel, author. Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla. [electronic resource] First edition. Weinheim : Wiley-VCH, [2014] ©2014 1 online resource (xvi, 328 pages) : illustrations text txt rdacontent computer c rdamedia online resource cr rdacarrier Edition statement from running title area. Includes bibliographical references and index. Online resource; title from PDF title page (Wiley, viewed August 1, 2014). Interferometry. Diffraction patterns. Optical measurements. SCIENCE Energy. bisacsh SCIENCE Mechanics General. bisacsh SCIENCE Physics General. bisacsh Diffraction patterns. fast (OCoLC)fst00893521 Interferometry. fast (OCoLC)fst00976235 Optical measurements. fast (OCoLC)fst01046776 Interferometrie. (DE-588)4027296-5 gnd Beugungsfigur. (DE-588)4631881-1 gnd Electronic books. Electronic books. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author. Print version: Servín, Manuel. Fringe pattern analysis for optical metrology. Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, [2014] 9783527411528 (OCoLC)884739610 http://onlinelibrary.wiley.com/book/10.1002/9783527681075 Wiley Online Library ddc BK 207490 207490