Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla. [electronic resource] Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author. Interferometry. Diffraction patterns. Optical measurements. QC39 .S384 2014 530.8 Edition statement from running title area. Includes bibliographical references and index. Online resource; title from PDF title page (Wiley, viewed August 1, 2014). 2014 Text 1 online resource (xvi, 328 pages) : http://onlinelibrary.wiley.com/book/10.1002/9783527681075 eng Fringe pattern analysis for optical metrology. Fringe pattern analysis for optical metrology.