05553cam a2200709 i 4500 ocn879329842 OCoLC 20170612141709.0 m o d cr ||||||||||| 140505s2014 nju ob 001 0 eng 2014017866 DLC eng rda DLC YDX N$T YDXCP EBLCP IDEBK OCLCF DG1 RECBK E7B DEBSZ UWO DG1 891400216 961536162 962611421 9781118916773 (epub) 1118916778 (epub) 9781118916766 (pdf) 111891676X (pdf) 9781118480489 (hardback) 9781118916780 1118916786 AU@ 000052810013 CHVBK 325941467 CHBIS 010259806 NZ1 15909356 DEBSZ 431751781 (OCoLC)879329842 (OCoLC)891400216 (OCoLC)961536162 (OCoLC)962611421 pcc QD96.S43 SCI 013010 bisacsh 543/.65 23 SCI013010 bisacsh MAIN Van der Heide, Paul, 1962- author. Secondary ion mass spectrometry : an introduction to principles and practices / P.A.W. van der Heide. Hoboken, New Jersey : Wiley, [2014] 1 online resource. text rdacontent computer rdamedia online resource rdacarrier Includes bibliographical references and index. "This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"-- Provided by publisher. Machine generated contents note: Forward x Preface xi Acknowledgements xiv List of physical constants xiv Chapter 1: Introduction 1.1 Matter and the Mass Spectrometer 1.2 Secondary Ion Mass Spectrometry 1.3 Summary Section I Chapter 2: Properties of atoms, ions, molecules and solids 2.1 The Atom 2.2 Electronic structure of atoms and ions 2.3 Summary Chapter 3: Current understanding of sputtering and ion formation 3.1 The fundamentals of SIMS 3.2 Sputtering 3.3 Ionization/neutralization 3.4 Summary Section II Chapter 4: Instrumentation 4.1 The science of measurement 4.2 Hardware 4.3 Summary Chapter 5: Data collection 5.1 The art of measurement 5.2 Sample preparation and handling 5.3 Data collection 5.4 Data conversion 5.5 Summary Appendix i) Periodic table of the elements ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements iii) 1st and 2nd Ionization potentials and electron affinities of the elements iv) Work-functions of elemental solids v) SIMS detection limits of selected elements vi) Charged particle beam transport vii) Statistical properties viii) SIMS instrument designs ix) Additional SIMS methods of interest x) Additional spectrometric/spectroscopic techniques xi) Additional microscopic techniques xii) Diffraction / reflection techniques Technique acronym list Abbreviations commonly used in SIMS Glossary of terms Questions and answers References Index Notes . Description based on print version record and CIP data provided by publisher. Chapter 1. Introduction: 1.1 Matter and the Mass Spectrometer ; 1.2 Secondary Ion Mass Spectrometry ; 1.3 Summary -- Chapter 2. Properties of atoms, ions, molecules and solids: 2.1 The Atom ; 2.2 Electronic structure of atoms and ions -- Chapter 3. Current understanding of sputtering and ion formation: 3.1 The fundamentals of SIMS ; 3.2 Sputtering ; 3.3 Ionization/neutralization ; 3.4 Summary -- Chapter 4. Instrumentation: 4.1 The science of measurement ; 4.2 Hardware -- Chapter 5. Data collection: 5.1 The art of measurement ; 5.2 Sample preparation and handling ; 5.3 Data collection ; 5.4 Data conversion -- Appendix i) Periodic table of the elements ; ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements ; iii) 1st and 2nd Ionization potentials and electron affinities of the elements ; iv) Work-functions of elemental solids ; v) SIMS detection limits of selected elements ; vi) Charged particle beam transport ; vii) Statistical properties ; viii) SIMS instrument designs ; ix) Additional SIMS methods of interest ; x) Additional spectrometric/spectroscopic techniques ; xi) Additional microscopic techniques ; xii) Diffraction / reflection techniques -- Technique acronym list -- Abbreviations commonly used in SIMS. Secondary ion mass spectrometry. SCIENCE / Chemistry / Analytic. bisacsh Secondary ion mass spectrometry. fast (OCoLC)fst01110604 Electronic books. Electronic books. Print version: Van der Heide, Paul, 1962- author. Secondary ion mass spectrometry Hoboken, New Jersey : John Wiley & Sons, Inc., [2014] 9781118480489 (DLC) 2014011448 http://onlinelibrary.wiley.com/book/10.1002/9781118916780 Wiley Online Library EBSCOhost EBSC 834736 YBP Library Services YANK 12043970 EBL - Ebook Library EBLB EBL1770689 Ingram Digital eBook Collection IDEB cis29660241 Recorded Books, LLC RECE rbeEB00545902 YBP Library Services YANK 11632362 ebrary EBRY ebr10913519 YBP Library Services YANK 13035655 92 DG1 207419 207419