05347cam a2200781 i 4500 ocn851285730 OCoLC 20171106095603.0 m o d cr ||||||||||| 130627s2013 enk ob 001 0 eng 2013026202 9781118703335 (ePub) 1118703332 (ePub) 9781118703342 (Adobe PDF) 1118703340 (Adobe PDF) 9781118511886 (hardback) 9781118703328 1118703324 9781299831124 (MyiLibrary) 1299831125 (MyiLibrary) 1118511883 (hdbk.) 9781118511886 (hdbk.) AU@ 000051686184 NZ1 15228751 DEBBG BV041634390 CHVBK 314703136 CHBIS 010131675 DKDLA 820120-katalog:000667531 DEBBG BV041911377 DEBBG BV042989359 DEBBG BV043396053 (OCoLC)851285730 (OCoLC)876848086 DLC eng rda DLC YDX N$T IDEBK CDX CUS COO YDXCP OCLCF E7B OTZ EBLCP DEBBG pcc MAIN TK7871.852 TEC 009070 bisacsh 621.3815 23 TEC008010 bisacsh Voldman, Steven H. Electrical overstress (EOS) : devices, circuits, and systems / Steven Voldman. [electronic resource] Chichester, West Sussex, United Kingdom : John Wiley & Sons Inc., 2013. 1 online resource. text rdacontent computer rdamedia online resource rdacarrier ESD series Includes bibliographical references and index. "Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today's modern world.Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today's semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author's series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era"-- Provided by publisher. "This book addresses EOS phenomena and distinguish it from other forms of phenomena such as electrostatic discharge (ESD), latchup, and EMC events"-- Provided by publisher. Description based on print version record and CIP data provided by publisher. Semiconductors Failures. Semiconductors Protection. Transients (Electricity) Overvoltage. TECHNOLOGY & ENGINEERING / Electronics / Circuits / General. bisacsh Overvoltage. fast (OCoLC)fst01049455 Semiconductors Failures. fast (OCoLC)fst01112222 Semiconductors Protection. fast (OCoLC)fst01112246 Transients (Electricity) fast (OCoLC)fst01154691 Electronic books. Electronic books. local Print version: Voldman, Steven H. Electrical overstress (EOS) Chichester, West Sussex, United Kingdom : John Wiley & Sons Inc., 2013 9781118511886 (DLC) 2013022183 ESD series. http://onlinelibrary.wiley.com/book/10.1002/9781118703328 Wiley Online Library ddc BK 206862 206862