00767cam a2200217 a 45000010008000000030008000080050017000160080041000330100017000740200015000910400027001060500023001330820021001562450139001772600051003163000034003675040051004016500035004526500034004877000028005212404955BD-DhUL20141106122158.0860404s1987    nyua     b    001 0 eng    a   86009141   a0442260709  aDLCcDLCdDLCdBD-DhUL00aQE471.2b.C57 198700a551.304219bCLA00aClastic particles :bscanning electron microscopy and shape analysis of sedimentary and volcanic clasts /cedited by John R. Marshall.  aNew York :bVan Nostrand Reinhold Co.,cc1987.  axii, 346 p. :bill. ;c27 cm.  aIncludes bibliographical references and index. 0aSediments (Geology)xAnalysis. 0aScanning electron microscopy.1 aMarshall, John R.,eed.