TY  - BOOK
AU  - Head, A. K.
TI  - Computed electron micrographs and defect identification
SN  - 0444104623
AV  - QD921 .C62
U1  - 544.82 
PY  - 1973///
CY  - Amsterdam
PB  - North-Holland Pub. Co.
KW  - Metals
KW  - Defects
KW  - Data processing
KW  - Electron microscopy
N1  - Bibliography: p. [387]-389
ER  -