00936cam a2200289 4500 4553216 BD-DhUL 20141027084337.0 750114s1973 ne a b 001 0 eng 72093092 Ne73-47 0444104623 (American Elsevier) DLC DLC DLC BD-DhUL QD921 .C62 544.82 HEC Computed electron micrographs and defect identification. By A. K. Head, P. Humble, L. M. Clarebrough, a.o. Amsterdam, North-Holland Pub. Co., 1973. x, 400 p. with illus. 23 cm. fl104.00 Defects in crystalline solids, v. 7 Bibliography: p. [387]-389. Metals Defects Data processing. Electron microscopy Data processing. Head, A. K. 7 cbc orignew 3 opcn 19 y-gencatlg ddc BK 16457 16457 0 0 ddc 0 544_820000000000000_HEC 0 NFIC 30898 DUSL DUSL GEN 1979-04-16 Gift 544.82 HEC A169815 2014-10-27 2014-10-27 BK