00826cam a2200253   45000010008000000030008000080050017000160080041000330100017000740150012000910200035001030400027001380500016001650820016001812450112001972600047003093000034003563500013003904400041004035040032004446500038004766500042005147000016005564553216BD-DhUL20141027084337.0750114s1973    ne a     b    001 0 eng    a   72093092   aNe73-47  a0444104623 (American Elsevier)  aDLCcDLCdDLCdBD-DhUL00aQD921b.C6200a544.82bHEC00aComputed electron micrographs and defect identification.cBy A. K. Head, P. Humble, L. M. Clarebrough, a.o.  aAmsterdam,bNorth-Holland Pub. Co.,c1973.  ax, 400 p. with illus.c23 cm.  afl104.00 0aDefects in crystalline solids,vv. 7  aBibliography: p. [387]-389. 0aMetalsxDefectsxData processing. 0aElectron microscopyxData processing.1 aHead, A. K.