Computed electron micrographs and defect identification. By A. K. Head, P. Humble, L. M. Clarebrough, a.o. Head, A. K. Metals Defects Data processing. Electron microscopy Data processing. QD921 .C62 544.82 HEC Bibliography: p. [387]-389. Amsterdam, North-Holland Pub. Co., 1973. 1973. 1973 Text x, 400 p. with illus. eng Defects in crystalline solids, v. 7