01297pam a2200337 a 4500 1460818 BD-DhUL 20141020160636.0 860418s1987 nyua b 001 0 eng 86011014 0471010561 DLC BD-DhUL BD-DhUL QD96.S43 B46 1987 543.0873 19 BES Benninghoven, A. Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends / A. Benninghoven, F.G. Rüdenauer, H.W. Werner. New York : J. Wiley, 1987. xxxv, 1227 p. : ill. ; 24 cm. Chemical analysis ; v. 86 "A Wiley-Interscience publication." Includes index. Bibliography: p. 1125-1216. Secondary ion mass spectrometry. Rüdenauer, F. G. Werner, H. W. Publisher description http://www.loc.gov/catdir/description/wiley031/86011014.html Table of Contents http://www.loc.gov/catdir/toc/onix01/86011014.html Contributor biographical information http://www.loc.gov/catdir/enhancements/fy0706/86011014-b.html 7 cbc orignew 1 ocip 19 y-gencatlg ddc BK 15391 15391 0 0 ddc 0 543_087300000000000_BES 0 NFIC 28149 DUSL DUSL GEN 2014-10-20 Purchased 543.0873 BES 323096 2014-10-20 1 2014-10-20 BK