Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends / A. Benninghoven, F.G. Rüdenauer, H.W. Werner. Benninghoven, A. Rüdenauer, F. G. Werner, H. W. Secondary ion mass spectrometry. QD96.S43 B46 1987 543.0873 19 BES "A Wiley-Interscience publication." Includes index. Bibliography: p. 1125-1216. New York : J. Wiley, 1987. 1987. 1987 Text xxxv, 1227 p. : http://www.loc.gov/catdir/description/wiley031/86011014.html http://www.loc.gov/catdir/toc/onix01/86011014.html http://www.loc.gov/catdir/enhancements/fy0706/86011014-b.html eng Chemical analysis ; v. 86