01250cam a2200313 a 4500 3561249 BD-DhUL 20141015095635.0 980623s1998 nyua b 001 0 eng 98029986 0824790391 (alk. paper) DLC DLC DLC BD-DhUL QD506 .E44 1998 541.33 21 ELE Electrical phenomena at interfaces : fundamentals, measurements, and applications. 2nd ed., rev. and expanded / edited by Hiroyuki Ohshima, Kunio Furusawa. New York : M. Dekker, c1998. xiii, 628 p. : ill. ; 26 cm. Surfactant science series ; v. 76 Includes bibliographical references and index. Surface chemistry. Electric double layer. Ohshima, Hiroyuki, 1944- Furusawa, Kunio, 1937- Publisher description http://www.loc.gov/catdir/enhancements/fy0647/98029986-d.html 7 cbu orignew 1 ocip 19 y-gencatlg ddc BK pc03 to ja00 06-23-98; jd20 to jk05 (for NARs) 06-24-98; jk05 to jd20 06-24-98; jd20 06-24-98; jd99 06-24-98; jd85 06-25-98; CIP ver. jc09 11-19-98 14689 14689 0 0 ddc 0 541_330000000000000_ELE 0 NFIC 26519 DUSL DUSL GEN 2003-05-11 Purchase 0.00 541.33 ELE 406024 2014-10-15 2014-10-15 BK