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  xmlns:dcterms="http://purl.org/dc/terms/"><dc:Title>Electrical phenomena at interfaces : fundamentals, measurements, and applications.</dc:Title>
<dc:Creator>Ohshima, Hiroyuki, 1944-</dc:Creator>
<dc:Creator>Furusawa, Kunio, 1937-</dc:Creator>
<dc:Subject>Surface chemistry.</dc:Subject>
<dc:Subject>Electric double layer.</dc:Subject>
<dc:Subject>QD506 .E44 1998</dc:Subject>
<dc:Subject>541.33 21 ELE</dc:Subject>
<dc:Description>Includes bibliographical references and index.</dc:Description>
<dc:Publisher>New York : M. Dekker,</dc:Publisher>
<dc:Date>c1998.</dc:Date>
<dc:Date>c1998.</dc:Date>
<dc:Date>1998</dc:Date>
<dc:Type>Text</dc:Type>
<dc:Format>xiii, 628 p. :</dc:Format>
<dc:Identifier>http://www.loc.gov/catdir/enhancements/fy0647/98029986-d.html</dc:Identifier>
<dc:Language>eng</dc:Language>
<dc:Relation>Surfactant science series ; v. 76</dc:Relation>

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