01725cam a22003491 4500 2667546 BD-DhUL 20140924164131.0 840419m19611962njua b 100 0 eng c 61012685 //r842 (OCoLC)ocm02834840 (NNC)2667546 DLC/ICU CGU OCL ZCU BD-DhUL TK7872.S4 S45 537.622 SHS TK7872.S4 Se52 Semiconductor reliability / edited by John E. Shwop, Harold J. Sulivan. Elizabeth, N.J. : Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York c1961. ix, 309 p.: ill. ; 22 cm. US$ 8.50 Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan. Vol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven. Semiconductors Reliability Congresses. Shwop, John E., editor. Von Alven, William H., editor. United States. Advisory Group on Electron Tubes. Aerospace Industries Association of America. Conference on Reliability of Semiconductor Devices (1961 : New York, N.Y.) Conference on Reliability Assurance Techniques for Semiconductor Specifications (1961 : Washington, D.C.) AUTH ddc BK 12831 12831 0 0 ddc 0 537_622000000000000_SHS 0 NFIC 22909 DUSL DUSL GEN 1962-06-01 Purchased 537.622 SHS A20559 2014-09-24 2014-09-24 BK