01619cam a22003011  45000010008000000030008000080050017000160080041000330100023000740350023000970350017001200400036001370500019001730820017001922450077002092600105002863000033003913650014004245000244004385000229006826500045009117000029009567000036009857100054010217100049010757110081011247110112012052667546BD-DhUL20140924164131.0840419m19611962njua     b    100 0 eng c  a   61012685 //r842  a(OCoLC)ocm02834840  a(NNC)2667546  aDLC/ICUcCGUdOCLdZCUdBD-DhUL0 aTK7872.S4bS450 a537.622bSHS00aSemiconductor reliability /cedited by John E. Shwop, Harold J. Sulivan.  aElizabeth, N.J. :bEngineering Publishers; trade distributors: Reinhold Pub. Corp., New Yorkcc1961.  aix, 309 p.: bill. ;c22 cm.  aUS$b8.50  aVol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan.  aVol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven. 0aSemiconductorsxReliabilityvCongresses.1 aShwop, John E.,eeditor.1 aVon Alven, William H.,eeditor.1 aUnited States.bAdvisory Group on Electron Tubes.2 aAerospace Industries Association of America.2 aConference on Reliability of Semiconductor Devicesd(1961 :cNew York, N.Y.)2 aConference on Reliability Assurance Techniques for Semiconductor Specificationsd(1961 :cWashington, D.C.)