Semiconductor reliability / edited by John E. Shwop, Harold J. Sulivan. Shwop, John E., editor. Von Alven, William H., editor. United States. Advisory Group on Electron Tubes. Aerospace Industries Association of America. Conference on Reliability of Semiconductor Devices (1961 : New York, N.Y.) Conference on Reliability Assurance Techniques for Semiconductor Specifications (1961 : Washington, D.C.) Semiconductors Reliability Congresses. TK7872.S4 S45 537.622 SHS Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan. Vol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven. Elizabeth, N.J. : Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York c1961. c1961. 1961 Text ix, 309 p.: eng